Large step-height measurements using multiple-wavelength holographic interferometry with tunable laser diodes.

Atsushi Wada1, Makoto Kato, Yukihiro Ishii

  • 1Department of Applied Physics, Tokyo University of Science, 1-3 Kagurazaka, Shinjuku-ku, Tokyo 162-8601, Japan. a24wada@nda.ac.jp

Summary

This study demonstrates accurate measurement of large step heights up to 18 mm using multiple-wavelength holographic interferometry with laser diodes. The method achieves high precision, with an RMS error of 0.04 mm, by utilizing tunable lasers for phase unwrapping.

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