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Updated: Jun 19, 2026

Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
Published on: January 26, 2016
Anna Karaiskou1, Vassilis Papadakis, Benoit Loppinet
1Department of Chemistry, University of Crete, 71003 Voutes-Heraklion, Greece.
This study enhances ellipsometric measurements using an optical cavity for increased sensitivity. This technique allows for the study of fast surface phenomena with unprecedented time resolution.
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