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Related Concept Videos

Standing Waves in a Cavity01:28

Standing Waves in a Cavity

A household microwave and lasers are examples of standing electromagnetic waves in a cavity. When two conducting metal plates are placed parallel at the nodal planes, it creates a cavity where standing waves are formed. The cavity between the two planes is analogous to a stretched string held at the points x = 0 and x = L. Here, the distance 'L' between the two planes must be an integer multiple of half of the wavelength. The wavelengths that satisfy this condition are given by:

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Related Experiment Video

Updated: Jun 19, 2026

Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
09:32

Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films

Published on: January 26, 2016

Cavity ring-down ellipsometry.

Anna Karaiskou1, Vassilis Papadakis, Benoit Loppinet

  • 1Department of Chemistry, University of Crete, 71003 Voutes-Heraklion, Greece.

The Journal of Chemical Physics
|October 2, 2009
PubMed
Summary
This summary is machine-generated.

This study enhances ellipsometric measurements using an optical cavity for increased sensitivity. This technique allows for the study of fast surface phenomena with unprecedented time resolution.

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Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
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Last Updated: Jun 19, 2026

Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
09:32

Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films

Published on: January 26, 2016

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
07:50

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization

Published on: July 17, 2015

Area of Science:

  • Surface science
  • Optical physics
  • Analytical chemistry

Background:

  • Ellipsometry is a powerful technique for characterizing thin films and surfaces.
  • Current ellipsometers have limitations in sensitivity and time resolution for studying dynamic surface processes.

Purpose of the Study:

  • To demonstrate enhanced ellipsometric measurements using multiple reflections within an optical cavity.
  • To achieve high phase shift sensitivity and submicrosecond time resolution for surface analysis.

Main Methods:

  • Utilizing a highly reflective target surface and an optical cavity to amplify polarized light reflections.
  • Measuring the adsorbed amount of molecular vapor (fenchone) onto ring-cavity mirrors to validate the principle.

Main Results:

  • Achieved a phase shift sensitivity of approximately 10(-2) degrees in a single 1-microsecond laser pulse.
  • Demonstrated the potential for sensitivities of at least 10(-4) degrees with further improvements.

Conclusions:

  • The developed method significantly enhances ellipsometric sensitivity and time resolution compared to commercial instruments.
  • This technique opens new possibilities for studying fast surface phenomena with high precision.