Linear polarization scans for resonant X-ray diffraction with a double-phase-plate configuration

Area of Science:

• Condensed matter physics
• Materials science
• X-ray optics

Background:

• Resonant X-ray diffraction (RXRD) is a powerful technique for probing electronic and magnetic structures.
• Polarization analysis in RXRD is crucial for disentangling complex ordering phenomena.
• Aberration effects from beam divergence and energy spread can limit the precision of polarization control.

Purpose of the Study:

• To present an in-vacuum double-phase-plate diffractometer for enhanced polarization control in RXRD.
• To improve the rate of rotated polarization compared to single-retarder systems.
• To enable more feasible low-energy RXRD experiments by minimizing absorption losses.

Main Methods:

• Development and implementation of an in-vacuum double-phase-plate diffractometer.
• Performance characterization through polarization scans.
• Application to study uranium M(4) edge in UO(2) using resonant X-ray diffraction.

Main Results:

• The double-phase-plate system achieves a higher rate of rotated polarization.
• Thinner phase plates can be utilized, reducing absorption, especially at low energies (e.g., 4 keV).
• Successful disentanglement of magnetic and quadrupole ordering contributions in UO(2) was demonstrated.

Conclusions:

• The double-phase-plate diffractometer offers significant advantages for polarization-dependent RXRD.
• This advancement is particularly beneficial for low-energy applications where absorption is critical.
• The technique provides a refined method for characterizing complex magnetic and electronic ordering in materials.