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Related Experiment Video

Updated: Jun 19, 2026

Optical Trap Loading of Dielectric Microparticles In Air

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Published on: February 5, 2017

Two-color trapped-particle optical microscopy.

L Malmqvist, H M Hertz

|October 22, 2009

Summary

This summary is machine-generated.

We developed a nonintrusive scanned near-field optical microscopy method using an optical trap and a lithium niobate particle. This technique generates a visible optical probe for high-resolution imaging of infrared-transparent samples.

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Last Updated: Jun 19, 2026

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Published on: January 15, 2013

Area of Science:

Optics
Microscopy
Nanotechnology

Background:

Scanned near-field optical microscopy (SNOM) offers high resolution but can be intrusive.
Developing nonintrusive microscopy techniques is crucial for sensitive sample analysis.

Purpose of the Study:

To demonstrate a novel nonintrusive scanned near-field optical microscopy method.
To achieve high-resolution imaging of infrared-transparent samples.

Main Methods:

Utilized an optical trap to precisely position a 50-100 nm lithium niobate particle.
Employed frequency doubling of an infrared trapping beam within the particle to create a visible optical probe.
Separated trapping and detection wavelengths for enhanced imaging.

Main Results:

Achieved a resolution of approximately 500 nm with current test objects.
Theoretical resolution demonstrated to be less than 100 nm.
Enabled positioning of infrared-transparent objects close to the probe for high resolution.

Conclusions:

The demonstrated method provides a nonintrusive approach to near-field optical microscopy.
The technique has the potential for sub-100 nm resolution imaging.
Applicable for high-resolution analysis of biological and other infrared-transparent materials.