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Super-resolution Fluorescence Microscopy

Super-resolution Fluorescence Microscopy

Super-resolution fluorescence microscopy (SRFM) provides a better resolution than conventional fluorescence microscopy by reducing the point spread function (PSF). PSF is the light intensity distribution from a point that causes it to appear blurred. Due to PSF, each fluorescing point appears bigger than its actual size, and it is the PSF interference of nearby fluorophores that causes the blurred image. Various approaches to achieving higher resolution through SRFM have recently been developed.

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Related Experiment Video

Updated: Jun 17, 2026

Conducting Multiple Imaging Modes with One Fluorescence Microscope

Conducting Multiple Imaging Modes with One Fluorescence Microscope

Published on: October 28, 2018

Resolving single-molecule assembled patterns with superresolution blink-microscopy.

Thorben Cordes¹, Mathias Strackharn, Stefan W Stahl

¹Applied Physics-Biophysics and Center for NanoScience, Ludwig-Maximilians-Universität, Amalienstrasse 54, D-80799 München, Germany.

|December 19, 2009

Summary

This summary is machine-generated.

This study combines single-molecule cut-and-paste (SMCP) assembly with Blink-Microscopy for superresolution imaging. Researchers resolved nanoscale SMCP structures below the diffraction limit, linking photophysical parameters to imaging resolution and speed.

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Last Updated: Jun 17, 2026

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Super-resolution Imaging of the Bacterial Division Machinery

Super-resolution Imaging of the Bacterial Division Machinery

Published on: January 21, 2013

Area of Science:

Nanotechnology
Microscopy
Biophysics

Background:

Single-molecule cut-and-paste (SMCP) is a novel technique for precise molecular assembly.
Superresolution microscopy techniques are crucial for visualizing nanoscale structures.
Blink-Microscopy offers a method for reconstructing superresolution images from fluctuating single-molecule emissions.

Purpose of the Study:

To integrate SMCP with Blink-Microscopy for enhanced nanoscale imaging.
To resolve SMCP-assembled structures with features beyond the diffraction limit.
To characterize the relationship between photophysical parameters and superresolution imaging performance.

Main Methods:

Experimental combination of AFM-based SMCP with Blink-Microscopy.
Utilizing fluctuating single-molecule emission for superresolution image reconstruction.
Employing artificial line patterns for calibration and resolution characterization.

Main Results:

Successfully resolved SMCP-assembled structures with sub-diffraction limit features.
Characterized the influence of labeling density and other parameters on Blink-Microscopy resolution.
Demonstrated the link between adjustable photophysical parameters, spatial resolution, and acquisition time.

Conclusions:

The integration of SMCP and Blink-Microscopy enables high-resolution imaging of molecular assemblies.
Photophysical parameter tuning is critical for optimizing superresolution imaging resolution and speed.
This approach provides a powerful platform for nanoscale structure characterization.