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Super-resolution Fluorescence Microscopy

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Updated: Jun 17, 2026

Measurement of Scattering Nonlinearities from a Single Plasmonic Nanoparticle

Measurement of Scattering Nonlinearities from a Single Plasmonic Nanoparticle

Published on: January 3, 2016

Topography and refractometry of nanostructures using spatial light interference microscopy.

Zhuo Wang¹, Ik Su Chun, Xiuling Li

¹Department of Electrical and Computer Engineering, Beckman Institute for Advanced Science and Technology,University of Illinois at Urbana-Champaign, Urbana, Illinois 61801, USA.

|January 19, 2010

Summary

This summary is machine-generated.

Spatial light interference microscopy (SLIM) achieves high accuracy for imaging transparent structures. This novel method enables single atomic layer topography in graphene and refractive index measurements of nanostructures.

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Nanotopology of Cell Adhesion upon Variable-Angle Total Internal Reflection Fluorescence Microscopy (VA-TIRFM)

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Area of Science:

Optical microscopy
Nanotechnology
Biophysics

Background:

Quantitative phase imaging is crucial for analyzing transparent materials.
Existing methods lack the required accuracy for atomic-level topographical analysis.
Characterizing nanostructures necessitates precise refractive index measurements.

Purpose of the Study:

To introduce and validate Spatial Light Interference Microscopy (SLIM) for high-resolution imaging.
To demonstrate SLIM's capability for atomic-level topography.
To showcase SLIM's application in extracting refractive indices of nanostructures.

Main Methods:

Utilized white light illumination and common path interferometric geometry in SLIM.
Applied SLIM for topographical mapping of graphene at the atomic layer scale.
Developed a decoupling procedure for analyzing cylindrical nanostructures with SLIM.

Main Results:

Achieved 0.3 nm spatial and 0.03 nm temporal accuracy with SLIM.
Successfully performed single atomic layer topography on graphene.
Extracted the refractive index of semiconductor nanotubes and a live neuronal neurite.

Conclusions:

SLIM offers unprecedented accuracy for quantitative phase imaging.
The study establishes SLIM as a powerful tool for nanostructure topography and refractometry.
SLIM has potential applications in high-throughput analysis of both artificial and biological nanostructures.