Measurement of temperature-dependent diffusion coefficients using a confocal Raman microscope with microfluidic chips

Ying Lin1, Xinhai Yu, Zhenyu Wang

  • 1Key Laboratory of Pressurized Systems and Safety, Ministry of Education, School of Mechanical and Power Engineering, East China University of Science and Technology, Shanghai, 200237, China.

Summary

This study introduces a faster method for measuring temperature-dependent diffusion coefficients (D) using Raman microscopy and microfluidic chips. Coating channels with aluminum film accurately eliminates laser heating effects, ensuring reliable D measurements.

Related Concept Videos