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Related Concept Videos

Atomic Emission Spectroscopy: Overview01:20

Atomic Emission Spectroscopy: Overview

Atomic emission spectroscopy (AES) is an analytical technique used to determine the elemental composition of a sample by analyzing the light emitted from excited atoms. In AES, atoms in a sample are excited to higher energy levels by thermal energy from high-temperature sources, such as plasma, arcs, or sparks. When these excited atoms return to lower energy states, they emit light at specific wavelengths characteristic of each element. The resulting atomic emission spectrum, which consists of...
Atomic Spectroscopy: Absorption, Emission, and Fluorescence01:23

Atomic Spectroscopy: Absorption, Emission, and Fluorescence

Atomic spectroscopy is a vital tool in elemental analysis, both qualitatively and quantitatively. It can be broadly divided into optical spectroscopy, mass spectroscopy, and X-ray spectroscopy methods. The optical spectroscopic methods are atomic absorption spectroscopy (AAS), atomic emission spectroscopy (AES), and atomic fluorescence spectroscopy (AFS). The first step in all three methods is atomization, where the solid, liquid, or solution-phase samples are converted into gas-phase atoms and...
Atomic Emission Spectroscopy: Lab01:29

Atomic Emission Spectroscopy: Lab

AES is a powerful analytical technique, especially effective when used with plasma sources, producing abundant spectra in characteristic emission lines. The Inductively Coupled Plasma (ICP), in particular, yields superior quantitative analytical data due to its high stability, low noise, low background, and minimal interferences under optimal experimental conditions. However, newer air-operated microwave sources are emerging as promising alternatives that could be more cost-effective than...
Mass Spectrum: Interpretation01:24

Mass Spectrum: Interpretation

An unknown compound can be established by identifying the molecular ion peak in the mass spectrum. The molecular ion peak is often weak or absent due to the predominance of fragmentation in high-energy electron beams. In such cases, a soft-energy electron beam can be used to scan the spectrum to enhance the intensity of the molecular ion peak. Additionally, chemical ionization, field ionization, and desorption ionization spectra are used to obtain a relatively intense molecular ion peak.To...
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
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Atomic Emission Spectroscopy: Instrumentation01:22

Atomic Emission Spectroscopy: Instrumentation

The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers.  Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.

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Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−
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Published on: July 27, 2018

Extracting physically interpretable data from electron energy-loss spectra.

C Witte1, N J Zaluzec, L J Allen

  • 1School of Physics, University of Melbourne, Parkville, Victoria 3010, Australia.

Ultramicroscopy
|July 24, 2010
PubMed
Summary
This summary is machine-generated.

Principal component analysis (PCA) in electron energy-loss spectroscopy (EELS) can yield meaningful spectra. By considering probe electron scattering and experimental geometry, PCA results are equivalent to polarized X-ray experiments.

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Area of Science:

  • Materials Science
  • Spectroscopy
  • Data Analysis

Background:

  • Principal component analysis (PCA) is a common technique for analyzing electron energy-loss spectroscopy (EELS) data.
  • Extracting physically meaningful information from PCA components in EELS can be challenging.

Purpose of the Study:

  • To develop a method for obtaining physically meaningful spectra from PCA components in EELS.
  • To demonstrate the application of this method to EELS data of the carbon K edge in graphite.

Main Methods:

  • Applied PCA to EELS data.
  • Incorporated knowledge of probe electron scattering and experimental geometry.
  • Validated results against polarized X-ray spectroscopy.

Main Results:

  • Developed a method to derive physically meaningful spectra from PCA components in EELS.
  • Demonstrated the method's effectiveness on carbon K edge EELS data from graphite.
  • Obtained spectra equivalent to those from linearly polarized X-ray experiments.

Conclusions:

  • The developed approach allows for the extraction of interpretable spectral information from PCA in EELS.
  • This method enhances the utility of PCA for EELS data analysis in conventional and scanning transmission electron microscopy.