Multi-pinhole SPECT Imaging with Silicon Strip Detectors

Todd E Peterson1, Sepideh Shokouhi, Lars R Furenlid

  • 1Institute of Imaging Science and the Department of Radiology and Radiological Sciences, Vanderbilt University, Nashville, TN 37232 USA (telephone: 615-322-2648, todd.e.peterson@vanderbilt.edu ).

IEEE Transactions on Nuclear Science
|September 28, 2011
PubMed
Summary

Silicon strip detectors enable high-resolution imaging of iodine-125 emissions. A prototype system achieved sub-millimeter resolution using a 23-pinhole collimator and a synthetic-collimator approach.