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Updated: Jun 4, 2026
06:48
A Multimodal Wide-Field Fourier-Transform Raman Microscope
Published on: December 30, 2025
Characterization of multilayered glitter particles using synchrotron FT-IR microscopy.
Laetitia Vernoud1, Hans A Bechtel, Michael C Martin
1Ecole Nationale Supérieure d'Ingénieurs de Caen (ENSICAEN), Caen, France.
Forensic Science International
|March 1, 2011
Summary
Researchers analyzed glitter particles using advanced microscopy. This technique quickly revealed detailed chemical information from individual layers, enhancing glitter
Area of Science:
- Forensic Science
- Materials Science
- Analytical Chemistry
Background:
- Glitter particles are common trace evidence in forensic investigations.
- Detailed chemical analysis of multilayered glitter can be challenging.
- Understanding glitter composition aids in linking suspects to crime scenes.
Purpose of the Study:
- To develop a rapid method for analyzing the chemical composition of individual layers within multilayered glitter particles.
- To assess the utility of synchrotron-based Fourier-transform infrared (FT-IR) microscopy for forensic glitter analysis.
- To enhance the evidential value of glitter in criminal cases.
Main Methods:
- Multilayered glitter particles were sectioned using a microtome.
- Cross-sections were analyzed using Fourier-transform infrared (FT-IR) microscopy.
- A synchrotron infrared source was utilized for high-brightness illumination.
Main Results:
- High-quality infrared spectra were rapidly acquired from individual glitter layers.
- Synchrotron source enabled detailed chemical information retrieval from micro-scale features.
- The method successfully differentiated chemical compositions within the glitter structure.
Conclusions:
- Synchrotron-based FT-IR microscopy is a powerful tool for analyzing multilayered glitter.
- Detailed chemical profiling of glitter enhances its associative value in forensic casework.
- This technique offers a significant advancement in trace evidence analysis.
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