Integrated scanning Kelvin probe-scanning electrochemical microscope system: development and first applications.

Artjom Maljusch1, Bernd Schönberger, Armin Lindner

  • 1Analytische Chemie-Elektroanalytik & Sensorik, Ruhr-Universität Bochum, Bochum, Germany.

Analytical Chemistry
|June 17, 2011
PubMed
Summary

This study introduces a novel combined scanning Kelvin probe (SKP) and scanning electrochemical microscope (SECM) system. This integrated approach enables simultaneous surface potential and electrochemical measurements on the same sample area.

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