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Updated: Jun 1, 2026

Scanning-probe Single-electron Capacitance Spectroscopy
Published on: July 30, 2013
Integrated scanning Kelvin probe-scanning electrochemical microscope system: development and first applications.
Artjom Maljusch1, Bernd Schönberger, Armin Lindner
1Analytische Chemie-Elektroanalytik & Sensorik, Ruhr-Universität Bochum, Bochum, Germany.
This study introduces a novel combined scanning Kelvin probe (SKP) and scanning electrochemical microscope (SECM) system. This integrated approach enables simultaneous surface potential and electrochemical measurements on the same sample area.
Area of Science:
- Surface science
- Electrochemistry
- Scanning probe microscopy
Background:
- Scanning Kelvin Probe (SKP) measures surface potential.
- Scanning Electrochemical Microscope (SECM) analyzes local electrochemical activity.
- Simultaneous measurements offer deeper material insights.
Purpose of the Study:
- To integrate SKP and SECM into a single, versatile platform.
- To demonstrate the technical realization and capabilities of the SKP-SECM system.
- To evaluate the system's performance for surface analysis.
Main Methods:
- A Pt disk electrode was used for both SKP and SECM modes.
- Piezoelectric actuator enabled tip oscillation for SKP.
- Redox-competition mode (RC-SECM) was employed for electrochemical imaging.
- Ultralow noise amplifier and backing potential controlled CPD detection.
- Tip-to-sample distance controlled via AC voltage application.
Main Results:
- The SKP-SECM system successfully performed simultaneous CPD and electrochemical measurements.
- Constant distance CPD measurements were achieved in air and electrolyte.
- Evaluated on Pt and W films on Si, CPD values correlated with known data.
- Higher oxygen reduction activity observed over Pt compared to W.
Conclusions:
- The integrated SKP-SECM system offers a powerful tool for correlative surface analysis.
- It allows for efficient, same-area measurements under various conditions without sample manipulation.
- The system demonstrates potential for advanced materials characterization.
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