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Updated: May 31, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

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Published on: October 11, 2016

Framework for three-dimensional coherent diffraction imaging by focused beam x-ray Bragg ptychography.

Stephan O Hruszkewycz¹, Martin V Holt, Ash Tripathi

¹Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439, USA. shrus@anl.gov

|June 21, 2011

Summary

This summary is machine-generated.

Convergent beam Bragg ptychography enables nanocrystal reconstruction from X-ray diffraction data. This advanced imaging technique uses a 3D ptychographic iterative engine for high-resolution analysis.

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Area of Science:

Materials Science
Crystallography
Coherent X-ray Diffraction Imaging

Background:

Nanocrystal characterization is crucial for materials science.
Ptychography offers high-resolution imaging but requires adaptation for 3D nanocrystals.
Convergent beam X-ray diffraction presents unique challenges for reconstruction.

Purpose of the Study:

To develop and validate a framework for convergent beam Bragg ptychography.
To demonstrate the feasibility of reconstructing nanocrystals using this method.
To extend ptychographic reconstruction to three dimensions for complex samples.

Main Methods:

Simulations of highly convergent X-ray Bragg diffraction.
Extension of the ptychographic iterative engine to three dimensions.
Utilizing overlapping raster scans with a defocused curved beam matching crystal size.

Main Results:

Successful ptychographic reconstruction of a simulated nanocrystal.
Demonstration of the framework's capability with complex diffraction patterns.
Validation of the 3D iterative engine for nanocrystal imaging.

Conclusions:

Convergent beam Bragg ptychography is a viable method for nanocrystal reconstruction.
The developed framework is suitable for coherent scanning nanoprobe X-ray sources.
This strategy advances coherent diffraction imaging of nanomaterials.