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Updated: May 31, 2026

High-Speed Magnetic Tweezers for Nanomechanical Measurements on Force-Sensitive Elements
Published on: May 12, 2023
Hysteresis loops of individual Co nanostripes measured by magnetic force microscopy
Miriam Jaafar1, Luis Serrano-Ramón, Oscar Iglesias-Freire
1Instituto de Ciencia de Materiales de Madrid, CSIC, Madrid, 28049, Spain. aasenjo@icmm.csic.es.
Abstract:
High-resolution magnetic imaging is of utmost importance to understand magnetism at the nanoscale. In the present work, we use a magnetic force microscope (MFM) operating under in-plane magnetic field in order to observe with high accuracy the domain configuration changes in Co nanowires as a function of the externally applied magnetic field. The main result is the quantitative evaluation of the coercive field of the individual nanostructures. Such characterization is performed by using an MFM-based technique in which a map of the magnetic signal is obtained as a function of both the lateral displacement and the magnetic field.
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