In-situ observation and relocation method of nanomaterial samples based on microscope systems
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Updated: May 31, 2026

A Novel Method for In Situ Electromechanical Characterization of Nanoscale Specimens
Published on: June 2, 2017
Leyong Zeng1, Aiguo Wu, Yazhuo Wang
1Division of Functional Materials and Nano Devices, Key Laboratory of Magnetic Materials and Devices, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo 315201, People's Republic of China.
Abstract:
Taking poly(lactic acid) microbubbles and purple membranes as examples, a general in situ observation and relocation method of nanomaterial samples based on microscope systems was reported. First, a four-grade coordinate with different precisions was marked around a substrate by UV lithography. Second, using optical microscope and scanning probe microscope, special positions of poly(lactic acid) microbubbles and purple membranes were observed, respectively. Third, the four-grade coordinate value corresponded to the special sample position, and the distance between the special position and coordinate edge were recorded, respectively. Finally, the special position can be easily found again, or the sample in the special position can be manipulated and secondary processed based on the recorded coordinate value and distance, after the sample was removed and then was reset on the sample stage of microscope. The in situ observation and relocation method can be applied in different microscope systems and different sample substrates, and will have potential applications in the manipulation and the secondary process of micro- and nano-devices.

