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A Method for Studying the Temperature Dependence of Dynamic Fracture and Fragmentation
Published on: June 28, 2015
Temperature dependence of the energy dissipation in dynamic force microscopy
Tino Roll1, Tobias Kunstmann, Markus Fendrich
1Fachbereich Physik, Universität Duisburg-Essen, D-47048 Duisburg, Germany.
Nanotechnology
|August 6, 2011
Summary
Energy dissipation in dynamic force microscopy was studied across temperatures. While PTCDA showed expected behavior, KBr revealed a novel dissipation mechanism, challenging current models.
Area of Science:
- Materials Science
- Surface Science
- Nanotechnology
Background:
- Dynamic Force Microscopy (DFM) commonly explains energy dissipation via adhesion hysteresis.
- This mechanism is predicted to decrease in efficiency as temperature rises.
- Understanding temperature-dependent dissipation is crucial for advanced microscopy applications.
Purpose of the Study:
- To investigate the temperature dependence of energy dissipation in DFM.
- To compare experimental results with the adhesion hysteresis model.
- To identify novel dissipation mechanisms in different materials.
Main Methods:
- Dynamic Force Microscopy (DFM) was employed to measure topography and energy dissipation.
- Experiments were conducted on 3,4,9,10-perylenetetracarboxylic-dianhydride (PTCDA) on KBr(001) substrates.
- Measurements spanned a temperature range from 100 K to 300 K.
Main Results:
- Energy dissipation at room temperature was 1.9 eV/cycle for PTCDA and 2.7 eV/cycle for KBr.
- PTCDA exhibited a decrease in energy dissipation with increasing temperature (negative temperature coefficient).
- KBr showed an increase in energy dissipation with increasing temperature (positive temperature coefficient).
Conclusions:
- The dissipation behavior of PTCDA aligns with the adhesion hysteresis model.
- The positive temperature coefficient observed for KBr suggests a previously unidentified energy dissipation mechanism.
- This finding necessitates further research into alternative dissipation pathways in dynamic force microscopy.
