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Exploring different inelastic projection mechanisms for electron tomography

B Goris1, S Bals, W Van den Broek

  • 1EMAT, University of Antwerp, Groenenborgerlaan 171, B-2020 Antwerp, Belgium. bart.goris@ua.ac.be

Ultramicroscopy
|August 26, 2011
PubMed
Summary

This study compares inelastic electron tomography methods, including energy filtered transmission electron microscopy (EFTEM), to standard HAADF-STEM tomography. It guides the selection of optimal techniques based on sample properties and desired information for materials science applications.

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