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Ultramicroscopy|August 26, 2011
Exploring different inelastic projection mechanisms for electron tomographyB Goris, S Bals, W Van den Broek, et al.
Ultramicroscopy|June 16, 2009
Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopyS Van Aert, J Verbeeck, R Erni, et al.
Ultramicroscopy|January 20, 2009
Tomographic spectroscopic imaging; an experimental proof of conceptW Van den Broek, J Verbeeck, D Schryvers, et al.
Nano Letters|November 25, 2010
Measuring porosity at the nanoscale by quantitative electron tomographyE Biermans, L Molina, K J Batenburg, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 5, 2013
Annular dark-field transmission electron microscopy for low contrast materialsF Leroux, E Bladt, J-P Timmermans, et al.
Nederlands Tijdschrift Voor Geneeskunde|March 24, 2005
[The practice guideline 'Depressive disorder' (first revision) from the Dutch College of General Practitioners; a response from the perspective of psychiatry]W W van den Broek
Ultramicroscopy|December 27, 2008
Effect of amorphous layers on the interpretation of restored exit wavesS Van Aert, L Y Chang, S Bals, et al.
Ultramicroscopy|June 21, 2014
Atomic resolution mapping of phonon excitations in STEM-EELS experimentsR Egoavil, N Gauquelin, G T Martinez, et al.
Nanoscale|May 13, 2015
Phase problem in the B-site ordering of La2CoMnO6: impact on structure and magnetismR Egoavil, S Hühn, M Jungbauer, et al.
Ultramicroscopy|September 7, 2012
Advanced reconstruction algorithms for electron tomography: from comparison to combinationB Goris, T Roelandts, K J Batenburg, et al.
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