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Air-gap structure between integrated LiNbO3 optical modulators and micromachined Si substrates
Ryo Takigawa1, Eiji Higurashi, Tadatomo Suga
1Department of Precision Engineering, The University of Tokyo, 7-3-1 Hongo, Tokyo, 113-8656, Japan. takigawa.ryo@su.t.u-tokyo.ac.jp
Optics Express
|September 22, 2011
Summary
An air-gap structure prevents silicon substrate interference in lithium niobate (LiNbO3) optical modulators. This innovation enhances high-speed optoelectronic systems by overcoming substrate-induced frequency limitations.
Area of Science:
- Optoelectronics
- Materials Science
- Microsystems Engineering
Background:
- High-speed optoelectronic systems require efficient optical modulators.
- Integrated lithium niobate (LiNbO3) modulators face performance limitations due to silicon (Si) substrate permittivity.
- Substrate effects can reduce the resonant modulation frequency of LiNbO3 modulator chips.
Purpose of the Study:
- To investigate and mitigate the substrate effect on LiNbO3 optical modulators.
- To introduce an air-gap structure to improve modulator performance.
- To demonstrate a fabrication method for the air-gap structure.
Main Methods:
- Utilized low-temperature flip-chip bonding (100 °C).
- Employed silicon micromachining processes.
- Fabricated and experimentally verified an air-gap structure between LiNbO3 modulators and Si substrates.
Main Results:
- The high permittivity of Si substrates was shown to decrease the resonant modulation frequency.
- An air-gap structure effectively prevented the substrate effect.
- Successful fabrication of the air-gap structure was demonstrated.
Conclusions:
- The air-gap structure is a viable solution for overcoming substrate limitations in integrated LiNbO3 optical modulators.
- This approach enables higher resonant modulation frequencies for high-speed optoelectronic applications.
- The demonstrated fabrication method is compatible with existing semiconductor processes.

