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Characterization upon electrical hysteresis and thermal diffusion of TiAl3Ox dielectric film

Lei Shi1, Zhiguo Liu

  • 1Hefei National Laboratory for Physical Sciences at the Microscale, University of Science and Technology of China, Hefei, Anhui 230026, PR China. leishi@ustc.edu.cn.

Nanoscale Research Letters
|October 21, 2011
PubMed

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