Column-parallel correlated multiple sampling circuits for CMOS image sensors and their noise reduction effects

Sungho Suh1, Shinya Itoh, Satoshi Aoyama

  • 1Research of Institute, Shizuoka University, 3-5-1 Johoku Nakaku Hmamatsu, Shizuoka, Japan. shsuh@idl.rie.shizuoka.ac.jp

Summary

New correlated multiple sampling (CMS) circuits significantly reduce noise in low-noise complementary metal-oxide-semiconductor (CMOS) image sensors. These circuits offer improved performance for thermal, 1/f, and RTS noises, enhancing image quality.

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