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Updated: May 26, 2026
10:39
Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
Automatic XAFS measurement system developed at BL14B2 in SPring-8
Hiroshi Oji1, Yosuke Taniguchi, Sayaka Hirayama
1Japan Synchrotron Radiation Research Institute (JASRI), Sayo-gun, Hyogo, Japan. oji-h@spring8.or.jp
Journal of Synchrotron Radiation
|December 22, 2011
Summary
A new X-ray Absorption Fine Structure (XAFS) measurement system automates sample loading and detector adjustments. This novel system enhances efficiency and accuracy for analyzing up to 80 samples, improving data reliability.
Area of Science:
- Materials Science
- Analytical Chemistry
- Spectroscopy
Background:
- X-ray Absorption Fine Structure (XAFS) spectroscopy is a powerful technique for elemental and chemical state analysis.
- Traditional XAFS measurements can be time-consuming and require significant manual intervention for sample handling and instrument setup.
Purpose of the Study:
- To develop and present a novel, automated XAFS measurement system.
- To improve the efficiency, accuracy, and reliability of XAFS data acquisition.
Main Methods:
- Development of an integrated system for automated sample loading and detector adjustments.
- Implementation of automated optical component alignment procedures.
- Capability for performing XAFS measurements in both transmission and fluorescence modes.
Main Results:
- The developed system can accommodate up to 80 samples for automated measurement.
- Automated adjustments significantly reduce manpower and measurement time.
- Improved accuracy and reliability in sample alignments were achieved.
Conclusions:
- The novel automated XAFS system offers substantial improvements in throughput and precision.
- This system is expected to accelerate research and routine analysis utilizing XAFS spectroscopy.
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