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Updated: May 24, 2026

Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization
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Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization

Published on: July 12, 2016

Paradox of low field enhancement factor for field emission nanodiodes in relation to quantum screening effects

Tsung-Chieh Cheng1, Pai-Yen Chen, Shen-Yao Wu

  • 1Department of Mechanical Engineering, National Kaohsiung University of Applied Science, 415 Chien Kung Road, Sanmin District, Kaohsiung, 80778, Taiwan. tcchengme@cc.kuas.edu.tw.

Nanoscale Research Letters
|February 16, 2012
PubMed

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