Atomic Absorption Spectroscopy: Instrumentation
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X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells
Published on: August 20, 2019
1Muons, Inc., Batavia, Illinois 60510, USA. vadim@muonsinc.com
This study introduces a new method for measuring ion beam brightness, crucial for optimizing ion sources and low-energy beam transport. The technique allows for direct brightness determination, aiding in preserving beam quality.
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