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Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
Published on: June 13, 2023
W T Latt1, U-X Tan, C N Riviere
1Imperial College London, Department of Computing, London SW7 2AZ.
This study proposes a novel accelerometer placement strategy to maximize sensing resolution for surgical instrument motion in micromanipulation. The method enhances accuracy and offers flexibility, especially in confined spaces.
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