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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
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Mechanical properties of freely suspended semiconducting graphene-like layers based on MoS2

Andres Castellanos-Gomez1, Menno Poot, Gary A Steele

  • 1Kavli Institute of Nanoscience, Delft University of Technology, Lorentzweg 1, Delft 2628, CJ, The Netherlands. a.castellanosgomez@tudelft.nl.

Nanoscale Research Letters
|April 27, 2012
PubMed

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