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Current stress induced electrical instability in transparent zinc tin oxide thin-film transistors

Woo-Seok Cheong1, Jae-Heon Shin, Sung Mook Chung

  • 1New Devices and Materials Research Group, ETRI, Daejeon 305-700, Korea.

Journal of Nanoscience and Nanotechnology
|August 2, 2012
PubMed

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