Automated high throughput whole slide imaging using area sensors, flash light illumination and solid state light...

Area of Science:

• Digital pathology
• Biomedical imaging

Background:

• Whole slide imaging (WSI) technology has rapidly evolved through three generations.
• Third-generation WSI systems now possess the stability and throughput required for routine clinical diagnostics.

Purpose of the Study:

• To detail the engineering decisions and technical background behind 3DHISTECH's third-generation combined brightfield and fluorescent whole slide scanner.

Main Methods:

• The Panoramic 250 FLASH scanner employs Plan-Apochromat 20x and 40x objectives.
• It integrates a 2-megapixel 3CCD camera for brightfield and a scientific CMOS camera for fluorescence.
• Illumination is provided by a solid-state light engine for fluorescence and a strobe light for brightfield.

Main Results:

• The system achieves rapid scanning: 1 cm² at 45x resolution in 1 minute.
• Fluorescent slides (DAPI, FITC, TRITC) are scanned in 11 minutes per cm².
• The scanner supports automated, high-volume throughput with a 250-slide capacity in walk-away mode.

Conclusions:

• Advanced camera technology, electronics, and optics enable high-throughput, high-quality whole slide imaging for routine diagnostics.
• The system's capabilities extend to extended depth of field and Z-stack scanning using area scan technology.