Method for estimating the tip geometry of scanning ion conductance microscope pipets

Area of Science:

• Biophysics
• Nanotechnology
• Microscopy

Background:

• Scanning Ion Conductance Microscopy (SICM) enables high-resolution, contact-free imaging of biological samples under physiological conditions.
• Accurate SICM probe geometry is critical for imaging resolution but is challenging to determine.
• Current methods like electron microscopy (EM) are time-consuming, destructive, and do not reveal internal probe geometry.

Purpose of the Study:

• To develop a novel, non-destructive method for determining SICM probe geometry.
• To overcome the limitations of existing geometry estimation techniques, particularly EM.
• To enable more accurate quantification in SICM imaging and measurements.

Main Methods:

• A new analytical model is fitted to current changes observed during controlled breakage of the SICM pipet tip.
• The method utilizes data acquired directly from the SICM apparatus.
• Quasi-controlled breakage allows for in-situ characterization of probe geometry.

Main Results:

• The developed method successfully determines SICM probe geometry.
• This technique eliminates the need for electron microscopy for geometry estimation.
• The method provides crucial information about the internal geometry of the probe.

Conclusions:

• The novel method offers a routine and reliable way to characterize SICM probe geometry.
• This advancement significantly enhances the quantification capabilities of SICM.
• Improved probe geometry determination will lead to more accurate biological imaging and measurements using SICM.