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Simulation of Human-induced Vibrations Based on the Characterized In-field Pedestrian Behavior
Published on: April 13, 2016
Physically-based reduced order modelling of a uni-axial polysilicon MEMS accelerometer.
Aldo Ghisi1, Stefano Mariani, Alberto Corigliano
1Dipartimento di Ingegneria Strutturale, Politecnico di Milano, Piazza Leonardo da Vinci 32, 20133 Milano, Italy. aldo.ghisi@polimi.it
Sensors (Basel, Switzerland)
|December 4, 2012
Summary
This study numerically investigates MEMS accelerometers under impact. A simplified model accurately predicts system dynamics and proposes a correction for stress fields in micro-electro-mechanical systems (MEMS) during high-g shocks.
Area of Science:
- Mechanical Engineering
- Materials Science
- Micro-electro-mechanical Systems (MEMS)
Background:
- MEMS accelerometers are crucial for impact detection.
- Accurate simulation of their mechanical response under shock is vital for reliability.
- Existing models may lack efficiency or precision for high-g events.
Purpose of the Study:
- To numerically investigate the mechanical response of a polysilicon MEMS accelerometer during drop impacts.
- To develop and validate a simplified, physically-based reduced-order model for dynamic analysis.
- To enhance the model's accuracy for predicting stress fields in critical regions.
Main Methods:
- A simplified two-degrees-of-freedom model of the MEMS accelerometer's movable parts was developed.
- The reduced-order model's accuracy was validated against 3D finite element simulations.
- Experimental data from instrumented samples were used for further model assessment.
Main Results:
- The reduced-order model accurately captures the system dynamics of the MEMS accelerometer.
- A correction factor was introduced to improve stress field predictions, particularly near re-entrant corners.
- The validated model offers an efficient yet accurate approach for analyzing MEMS behavior under shock.
Conclusions:
- Simplified models can effectively simulate MEMS accelerometer dynamics under impact.
- Accounting for local stress amplification is necessary for accurate failure prediction in MEMS devices.
- This work provides a validated, efficient tool for MEMS accelerometer design and reliability analysis.

