Embedding defect sites into hexagonal nondiffracting wave fields
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Updated: May 16, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Andreas Kelberer1, Martin Boguslawski, Patrick Rose
1Institut für Angewandte Physik and Center for Nonlinear Science (CeNoS), Westfälische Wilhelms-Universität Münster, 48149 Münster, Germany.
Abstract:
We present a highly purposive technique to optically induce periodic photonic lattices enriched with a negative defect site by using a properly designed nondiffracting (ND) beam. As the interference of two or more ND beams with adequate mutual spatial frequency relations in turn reproduces an ND beam, we adeptly superpose a hexagonal and a Bessel beam to create the ND defect beam of demand. The presented wavelength-independent technique is of utmost universality in terms of structural scalability and does not make any specific requirements to the photosensitive medium. In addition, the technique is easily transferable to all pattern-forming holographic methods in general and its application is highly appropriate, e.g., in the fields of particle as well as atom trapping.
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