Imperfections in Crystal Structure: Stoichiometric Point Defects
Imperfections in Crystal Structure: Point, Line and Plane Defects
Imperfections in Crystal Structure: Non-Stoichiometric Defects
Standing Waves in a Cavity
X-ray Crystallography
Interference and Diffraction
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: May 16, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Andreas Kelberer1, Martin Boguslawski, Patrick Rose
1Institut für Angewandte Physik and Center for Nonlinear Science (CeNoS), Westfälische Wilhelms-Universität Münster, 48149 Münster, Germany.
Researchers developed a novel optical technique to create photonic lattices with defect sites using nondiffracting (ND) beams. This versatile method, combining hexagonal and Bessel beams, enables precise control for applications like particle trapping.
06:57Theoretical Calculation and Experimental Verification for Dislocation Reduction in Germanium Epitaxial Layers with Semicylindrical Voids on Silicon
Published on: July 17, 2020
10:35Using Microwave and Macroscopic Samples of Dielectric Solids to Study the Photonic Properties of Disordered Photonic Bandgap Materials
Published on: September 26, 2014
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: