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Updated: May 15, 2026

Theoretical Calculation and Experimental Verification for Dislocation Reduction in Germanium Epitaxial Layers with Semicylindrical Voids on Silicon
Published on: July 17, 2020
Comment on "The local structure of amorphous silicon"
Sjoerd Roorda1, Laurent J Lewis
1Département de Physique, Université de Montréal, Montréal, Québec, Canada. sjoerd.roorda@umontreal.ca
Abstract:
Treacy and Borisenko (Reports, 24 February 2012, p. 950) argue from reverse Monte Carlo modeling of electron diffraction and fluctuation electron microscopy data that amorphous silicon is paracrystalline and not described by a continuous random network. However, their models disagree with high-resolution x-ray measurements and other evidence, whereas the agreement with fluctuation electron microscopy is at best qualitative.
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