Real-time, high-resolution x-ray diffraction measurements on shocked crystals at a synchrotron facility

Area of Science:

• Materials Science
• Condensed Matter Physics
• High-Energy Physics

Background:

• Shock compression experiments require precise timing and detection for accurate microstructural analysis.
• Real-time X-ray diffraction offers a powerful tool for observing dynamic material responses.

Purpose of the Study:

• To determine the microscopic response of shock-compressed single crystals using real-time, high-resolution X-ray diffraction.
• To develop and validate synchronization and detection techniques for synchrotron-based X-ray measurements on dynamic samples.

Main Methods:

• Utilized the Advanced Photon Source (APS) for X-ray diffraction measurements.
• Employed a compact powder gun to accelerate projectiles for shock compression of single crystal samples.
• Developed novel synchronization and X-ray detection methods for single X-ray pulses (<100 ps) synchronized with sample shock state.

Main Results:

• Achieved real-time, high-resolution X-ray diffraction data of shock-compressed single crystals.
• Presented representative data for a shock-compressed Al(111) sample, revealing shock-induced microstructural changes.
• Validated analytic developments for analyzing diffraction patterns affected by crystal substructure and geometry.

Conclusions:

• The developed synchronization and detection techniques are applicable to various X-ray measurements on shock-compressed materials at the APS.
• The experimental advancements contributed to the development of the Dynamic Compression Sector (DCS) at the APS.
• The methods and analysis equations are suitable for high-resolution single crystal X-ray diffraction studies at the DCS.