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Modulation in current density of metal/n-SiC contact by inserting Al2O3 interfacial layer

Shan Zheng1, Qing-Qing Sun, Wen Yang

  • 1State Key Laboratory of ASIC and System, Department of Microelectronics, Fudan University, Shanghai, 200433, China. qqsun@fudan.edu.cn.

Nanoscale Research Letters
|March 5, 2013
PubMed

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