Performance and characterization of the prototype nm-scale spatial resolution scanning multilayer Laue lenses

E Nazaretski1, Jungdae Kim, H Yan

  • 1Brookhaven National Laboratory, Upton, New York 11973, USA.

Summary

Researchers developed advanced hard x-ray microscopy techniques to achieve 10 nm resolution. This breakthrough overcomes challenges in nano-focusing optics and microscope stability for high-spatial-resolution imaging.