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The Effect of Anodization Parameters on the Aluminum Oxide Dielectric Layer of Thin-Film Transistors
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Enhanced electrical properties of thin-film transistor with self-passivated multistacked active layers

Deuk Jong Kim1, You Seung Rim, Hyun Jae Kim

  • 1School of Electrical and Electronic Engineering, Yonsei University, Seodaemun-gu, Seoul, Korea.

ACS Applied Materials & Interfaces
|April 20, 2013
PubMed

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