Parallel scan-like test and multiple-defect diagnosis for digital microfluidic biochips

Dependability is an important attribute for microfluidic biochips that are used for safety-critical applications such as point-of-care health assessment, air-quality monitoring, and food-safety testing. Therefore, these devices must be adequately tested after manufacture and during bioassay operations. We propose a parallel scan-like testing methodology for digital microfluidic devices. A diagnosis method based on test outcomes is also proposed. The diagnosis technique is enhanced such that multiple defect sites can be efficiently located using parallel scan-like testing. Defect diagnosis can be used to reconfigure a digital microfluidic biochip such that faults can be avoided, thereby enhancing chip yield and defect tolerance. We evaluate the proposed method using complexity analysis as well as applying it to a fabricated biochip.