Quantification of metal ion induced DNA damage with single cell array based assay

Yong Qiao1, Liyuan Ma

  • 1NanoScience Technology Center, University of Central Florida, Orlando, Florida 32826, USA. liyuan.ma@ucf.edu.

The Analyst
|July 30, 2013
PubMed
Summary

Implanted orthopedic devices release metal ions causing DNA damage. A new single-cell method quantifies this damage, enabling personalized patient response prediction for medical implants.