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Using Laser Scanning Microscopy to Determine Electromigration in Molybdenum Disilicide

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Leakage radiation interference microscopy.

Emiliano Descrovi¹, Elsie Barakat, Angelo Angelini

¹Dipartimento di Scienza Applicata e Tecnologia, Politecnico di Torino, Torino, Italy.

|August 31, 2013

Summary

This summary is machine-generated.

This study introduces a novel imaging method combining leakage radiation and interference microscopy. The technique successfully maps surface modes on dielectric multilayers by retrieving optical field amplitude and phase.

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Area of Science:

Optics and Photonics
Materials Science
Surface Physics

Background:

Evanescent optical fields are crucial for studying surface phenomena.
Existing microscopy techniques face limitations in retrieving full optical field information.
Surface modes on dielectric structures are important for optical device applications.

Purpose of the Study:

To demonstrate a new imaging technique combining leakage radiation microscopy and high-resolution interference microscopy.
To retrieve both amplitude and phase information from evanescent optical fields.
To map surface mode propagation on a dielectric multilayer structure.

Main Methods:

Utilized oil immersion optics to access evanescent fields.
Combined leakage radiation microscopy with high-resolution interference microscopy.
Applied Fourier transformation to measured complex optical fields.

Main Results:

Successfully retrieved amplitude and phase of evanescent optical fields.
Mapped a surface mode propagating onto a planar dielectric multilayer.
Obtained surface mode propagation constant values matching independent measurements.

Conclusions:

The presented imaging technique offers a viable method for characterizing surface modes.
This approach allows for detailed analysis of optical fields near surfaces.
The technique shows promise for applications in nanophotonics and materials characterization.