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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

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Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
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Overview of Microscopy Techniques01:22

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The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
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Updated: Apr 25, 2026

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays
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A new ion sensing deep atomic force microscope.

Barney Drake1, Connor Randall1, Daniel Bridges1

  • 1Department of Physics, University of California, Santa Barbara, California 93106, USA.

The Review of Scientific Instruments
|September 1, 2014
PubMed
Summary
This summary is machine-generated.

A new deep atomic force microscope (AFM) integrates ion sensing with AFM imaging using a novel micropipette probe. This dual-functionality instrument provides simultaneous topography and ion current maps for advanced material and biological surface analysis.

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Area of Science:

  • Surface Science
  • Nanotechnology
  • Microscopy

Background:

  • Atomic Force Microscopy (AFM) is a powerful tool for nanoscale imaging.
  • Existing AFM techniques lack integrated ion sensing capabilities.
  • Developing novel probes for combined imaging and sensing is crucial for advanced characterization.

Purpose of the Study:

  • To introduce a novel deep atomic force microscope (AFM) with integrated ion sensing capabilities.
  • To demonstrate the simultaneous acquisition of AFM topography and ion current images.
  • To explore the potential of this instrument for diverse applications, including microfluidics and biological samples.

Main Methods:

  • Development of a novel probe assembly incorporating a micropipette for simultaneous ion sensing and AFM tip functionality.
  • Utilizing a unique suspension system for conventional micropipettes within the AFM.
  • Implementing passive ion current sensing with force feedback for AFM operation in contact mode.

Main Results:

  • Successful simultaneous imaging of AFM topography and ion current.
  • Demonstration of ion current peaks over microchannel edges in a MEMS device.
  • Validation of the instrument's gentle interaction with biological samples like plant leaves.

Conclusions:

  • The developed deep AFM offers a versatile platform for simultaneous topographical and ion current imaging.
  • The instrument's novel probe design enhances its applicability in microfluidic and biological research.
  • This technology opens new avenues for nanoscale surface analysis and characterization.