An integrated data analysis tool for improving measurements on the MST RFP

L M Reusch1, M E Galante1, P Franz2

  • 1Physics Department, University of Wisconsin-Madison, Madison, Wisconsin 53706, USA.

Summary

Combining data from plasma diagnostics like soft x-ray (SXR) and Thomson Scattering (TS) improves electron temperature accuracy. Integrated analysis using Bayesian methods and Markov Chain Monte Carlo offers more precise results than individual methods.