Determination of crystallographic intensities from sparse data.

Kartik Ayyer1, Hugh T Philipp1, Mark W Tate1

  • 1Laboratory of Atomic and Solid State Physics, Cornell University, Ithaca, NY 14853, USA.

Iucrj
|January 23, 2015
PubMed
Summary

Sparse data frames from X-ray serial microcrystallography, previously unusable, can now be merged to reconstruct molecular structures. This breakthrough removes limitations on X-ray source fluence, enabling analysis of smaller crystals.

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