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In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx
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Modeling of memristive and memcapacitive behaviors in metal-oxide junctions

M G A Mohamed1, HyungWon Kim2, Tae-Won Cho2

  • 1Electronic Engineering Department, Chungbuk National University, Cheongju 361-763, Republic of Korea ; Electrical Engineering Department, Faculty of Engineering, Minia University, Al-Minya 61111, Egypt.

Thescientificworldjournal
|February 24, 2015
PubMed

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