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Anatomy of screw dislocations in nanoporous SAPO-18 as revealed by atomic force microscopy

Rachel L Smith1, Anna Lind, Duncan Akporiaye

  • 1Centre for Nanoporous Materials, School of Chemistry, The University of Manchester, Oxford Road, Manchester M13 9PL, UK. m.anderson@manchester.ac.uk.

Chemical Communications (Cambridge, England)
|March 12, 2015
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Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
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The probe is regarded as the heart of any AFM setup and comprises the...
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