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Updated: Aug 18, 2026

Imaging Corrosion at the Metal-Paint Interface Using Time-of-Flight Secondary Ion Mass Spectrometry
Published on: May 6, 2019
A pulsed time-of-flight mass spectrometer for liquid secondary ion mass spectrometry
J K Olthoff1, I A Lys, R J Cotter
1Department of Pharmacology and Molecular Sciences, Johns Hopkins University, Baltimore, MD 21205.
Abstract:
The design and performance of a new time-of-flight mass spectrometer is reported. The instrument combines the advantages of a pulsed drawout TOF analyzer with a liquid secondary ion source. Differences from commercially available pulsed TOF analyzers (Wiley/McLaren type) are discussed with regard to operation with ion desorption from a liquid matrix.
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