A compact time-of-flight mass spectrometer for ion source characterization.

L Chen1, X Wan1, D Z Jin1

  • 1Institute of Electronic Engineering, China Academy of Engineering Physics, Mianyang, Sichuan 621900, China.

Summary

A new compact time-of-flight mass spectrometer was developed for ion source characterization. This device offers high mass resolution and a wide detection range, proving valuable for plasma research.

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