Related Experiment Video
Updated: Mar 30, 2026

11:32
High Pressure Single Crystal Diffraction at PX^2
Published on: January 16, 2017
22.2K
Pixelated transmission-mode diamond X-ray detector.
Tianyi Zhou1, Wenxiang Ding2, Mengjia Gaowei3
1Material Science and Engineering, Stony Brook University, Stony Brook, NY 11790, USA.
Journal of Synchrotron Radiation
|November 3, 2015
Summary
A new pixelated diamond X-ray detector was fabricated to measure X-ray beam flux, position, and morphology in real-time. This novel detector achieves high precision for beam characterization, crucial for advanced imaging applications.
Area of Science:
- Materials Science
- Particle Detectors
- X-ray Optics
Background:
- Real-time characterization of X-ray beams is essential for optimizing experiments and imaging.
- Existing detectors often lack the capability for simultaneous measurement of flux, position, and morphology.
- Diamond-based detectors offer potential advantages due to their material properties.
Purpose of the Study:
- To develop and test a prototype transmission-mode pixelated diamond X-ray detector.
- To enable simultaneous real-time measurement of X-ray beam flux, position, and morphology.
- To validate the detector's performance using synchrotron X-ray sources.
Main Methods:
- Fabrication of a pixelated diamond detector using lithographic patterning of vertical and horizontal stripes.
- Implementation of a novel signal readout scheme with rotated bias and current readout at ~1 kHz.
- Testing the detector at synchrotron beamlines (NSLS X28C and CHESS G3) with varying X-ray energies and flux densities.
Main Results:
- The detector achieved precise beam position measurement with positional noise within 1%.
- Accurate beam morphology information was obtained with an error within 2%.
- A software-controlled single channel mode provided accurate flux measurement with fluctuations within 1%.
Conclusions:
- The developed pixelated diamond X-ray detector successfully demonstrates simultaneous real-time measurement of X-ray beam properties.
- The novel readout scheme and detector design offer high precision and accuracy for beam characterization.
- This technology holds promise for advancing X-ray imaging and experimental analysis.

