Valence band offset at the Si/SiSn interface by applying deep level transient spectroscopy

Victor-Tapio Rangel-Kuoppa1, Alexander Tonkikh, Nikolay Zakharov

  • 1Institute of Semiconductor- and Solid State Physics, Johannes Kepler Universität, A-4040 Linz, Austria.

Nanotechnology
|January 19, 2016
PubMed
Summary

Hole activation energies in silicon-tin quantum wells increase with tin fraction. Valence band offsets were determined for pseudomorphic and unstrained Si1-x Sn x /Si heterojunctions.

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