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Updated: Mar 21, 2026

Measurement of Scattering Nonlinearities from a Single Plasmonic Nanoparticle

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Published on: January 3, 2016

Measuring chromatic aberrations in imaging systems using plasmonic nanoparticles.

Sylvain D Gennaro, Tyler R Roschuk, Stefan A Maier

|May 19, 2016

Summary

This summary is machine-generated.

This study presents a new, low-cost method using metallic nanoparticles to measure microscope objective chromatic aberrations. The technique accurately assesses longitudinal chromatic aberration in high-quality lenses.

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Last Updated: Mar 21, 2026

Measurement of Scattering Nonlinearities from a Single Plasmonic Nanoparticle

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Published on: November 21, 2019

Area of Science:

Optical microscopy
Nanotechnology
Metrology

Background:

Chromatic aberration in microscope objectives can degrade image quality.
Accurate measurement of chromatic aberration is crucial for high-resolution imaging.
Existing methods may be complex or costly.

Purpose of the Study:

To develop a straightforward, low-cost method for measuring chromatic aberrations of microscope objectives.
To utilize metallic nanoparticles and white light for this measurement.
To assess the sensitivity and robustness of the developed technique.

Main Methods:

Recording extinction spectra of a single metallic nanoparticle while scanning through the focal plane of a microscope objective.
Analyzing variations in extinction spectra to determine focal wavelength and longitudinal chromatic focal shift.
Testing the method on achromat and apochromat objectives with aluminum nanoparticles of varying sizes.

Main Results:

Demonstrated a direct correlation between focal wavelength and longitudinal chromatic focal shift.
The method is sensitive enough for high-numerical-aperture apochromatic lenses.
Successful application on different objective types and nanoparticle sizes.

Conclusions:

The developed nanoparticle-based method provides a robust, broadband, and cost-effective way to measure longitudinal chromatic aberrations.
This technique is suitable for characterizing high-performance microscope objectives.
Offers a practical alternative for optical metrology in microscopy.