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Recombination Dynamics in Thin-film Photovoltaic Materials via Time-resolved Microwave Conductivity
Published on: March 6, 2017
Jeffrey A Jargon1, Donald C DeGroot1, K C Gupta2
1National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80305.
This study introduces nonlinear large-signal scattering (S) parameters for analyzing signal behavior in electronic circuits. These new parameters offer a more general approach than existing methods for nonlinear circuit design and analysis.
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