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We introduce quantum error bars, a new method for characterizing quantum devices. This practical approach provides intuitive and concise error analysis for quantum tomography, improving experimental accuracy.

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Area of Science:

  • Quantum Information Science
  • Quantum Computing
  • Experimental Physics

Background:

  • Quantum tomography is essential for characterizing quantum devices.
  • Current methods like maximum likelihood estimation lack rigorous error analysis.
  • Existing confidence region methods are often impractical or produce overly large error bars.

Purpose of the Study:

  • To develop a practical and robust method for error bar determination in quantum tomography.
  • To introduce a novel representation called "quantum error bars" for concise and intuitive error quantification.

Main Methods:

  • Developed a novel representation of quantum tomography output termed "quantum error bars".
  • Created an algorithm for computing this representation.
  • Provided ready-to-use software for implementation.

Main Results:

  • The proposed quantum error bars are concise, intuitive, and contain information for confidence regions.
  • The method allows formulating statements in terms of figures of merit like fidelity.
  • Successfully applied the procedure to experimental data from two superconducting qubits.

Conclusions:

  • The novel quantum error bar method offers a practical and robust solution for error analysis in quantum device characterization.
  • This approach enhances the reliability and interpretability of quantum tomography results.
  • Demonstrated applicability to entangled states of superconducting qubits.